DIST: Defect Identification and Statistics Toolbox
Overview
The future of 2D materials depends on understanding how atomic defects affect electron propagation. STM produces images with atomic-level resolution and provide valuable information about defects in a material, including size, shape, and apparent height. However, identifying and analyzing defects in any SPM image is challenging, as noise present in the image will make defects less obvious. Computing defect statistics in currently available STM image analysis software can become tedious when a user has to individually identify and analyze multiple defects in a single image. DIST, a MATLAB toolbox, combines user input with automation to identify defects in STM images and automatically computes statistics such as apparent height and line profile to help researchers process data faster and more efficiently.
The components of DIST and a user guide can be found on GitHub: github.com/alanagudinas/Hollen-Lab.